Genetic algorithm using independent component analysis in x-ray reflectivity curve fitting of periodic layer structures

Journal of Physics D: Applied Physics

Volumn 40, Issue 19, 2007, Pages 6000-6004

  Tiilikainen, J ^a   Bosund, V ^a   Tilli, J M ^a   Sormunen, J ^a   Mattila, M ^a   Hakkarainen, T ^a   Lipsanen, H ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; GENETIC ALGORITHMS; MATHEMATICAL MODELS; MULTILAYERS; REFLECTION; X RAY ANALYSIS;

COMBINATORIAL PHASE; INTERPARAMETER DEPENDENCES; X-RAY REFLECTIVITY;

PERIODIC STRUCTURES;

EID: 34748870360     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/19/033     Document Type: Article

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