Measuring the PSF from aperture images of arbitrary shape - An algorithm

Ultramicroscopy

Volumn 94, Issue 2, 2003, Pages 135-148

  Nakashima, P N H ^a   Johnson, A W S ^a  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Aperture; Convergent beam electron diffraction; Digital image de convolution; Point spread function measurement

Indexed keywords

ALGORITHMS; CAMERAS; CONVOLUTION; ELECTRON BEAMS; ELECTRON DIFFRACTION; LIGHTING; OPTICAL FILTERS; OPTICAL TRANSFER FUNCTION; TRANSMISSION ELECTRON MICROSCOPY;

STEP FUNCTION EDGE;

IMAGING SYSTEMS;

ACCURACY; ALGORITHM; ARTICLE; CAMERA; ELECTRON DIFFRACTION; ELECTRON MICROSCOPE; FILTER; IMAGING SYSTEM; NOISE; THEORY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037293261     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00250-4     Document Type: Article

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