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34548827783
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note
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This value of the relative dielectric constant, reported in Refs. [25,26], is referred to a measurement performed in a sandwich type geometry with the electric field along the c-axis of the crystal.
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26
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34548817956
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O.D. Jurchescu, Ph.D. Thesis, RuG, 2006.
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33751009667
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12844256525
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15844410180
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36
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34548836904
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note
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In order to correct the well known DFT failures in predicting strongly localized and correlated core levels, Binding Energy values of C1s (Valence Band) are multiplied by a scale factor of 1.35 (1.2) and then rigidly shifted to fit the experimental ones.
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42
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1642559619
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0342546131
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Stanley H.E., and Ostrowsky N. (Eds), Martinus Nijhoff, Boston, MA
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Meakin P. In: Stanley H.E., and Ostrowsky N. (Eds). On Growth and Form (1986), Martinus Nijhoff, Boston, MA 120
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Meakin, P.1
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48
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34548862432
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note
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Ancillary X-ray diffraction measurements on 100 nm thick film reveal the presence of both crystalline phases with relative intensities comparable with those reported in Refs. [26,27].
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49
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34548856298
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note
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The resistivity value obtained here for the thin film is, affected by grain boundary effects, as showed by the morphological investigation. Such effects largely influence the transport and we believe that PQ bulk crystals may show a different behaviour.
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