Nano-structural properties of ZnO films for Si based heterojunction solar cells

Thin Solid Films

Volumn 515, Issue 24 SPEC. ISS., 2007, Pages 8479-8483

  Breivik, T H ^a   Diplas, S ^a   Ulyashin, A G ^b   Gunnaes A E ^a   Olaisen, B R ^b   Wright, D N ^b   Holt, A ^b   Olsen, A ^a  

^a UNIVERSITY OF OSLO   (Norway)

^b INSTITUTE FOR ENERGY TECHNOLOGY   (Norway)

Author keywords

a Si:H crystallization; AFM; Al doping; Magnetron sputtering; Optical properties; TEM; XPS; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); HETEROJUNCTIONS; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

AMORPHOUS LAYERS; CORE HOLES; INTERFACIAL LAYERS; NANOSTRUCTURAL FILMS;

SEMICONDUCTING FILMS;

EID: 34548813371     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.03.095     Document Type: Article

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