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Volumn 84, Issue 1-2, 2006, Pages 161-164
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Microstructure evolution of Al-doped zinc oxide films prepared by in-line reactive mid-frequency magnetron sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
DOPING (ADDITIVES);
MAGNETRON SPUTTERING;
MICROSTRUCTURE;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ZINC OXIDE;
CRYSTALLITES;
FILM STRUCTURE;
SUBSTRATE TEMPERATURE;
THIN FILMS;
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EID: 33646681026
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s00339-006-3581-5 Document Type: Article |
Times cited : (16)
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References (10)
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