Interface properties and electronic structure of ultrathin manganese oxide films on Ag(0 0 1)

Surface Science

Volumn 601, Issue 18, 2007, Pages 4484-4487

  Nagel, M ^a   Biswas, I ^a   Peisert, H ^a   Chasse T ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

Epitaxial growth; Low energy electron diffraction; Metal oxide interface; Near edge extended X ray absorption fine structure; Soft X ray photoelectron spectroscopy; Transition metal oxide; Ultrathin film

Indexed keywords

ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MANGANESE COMPOUNDS; SILVER; SINGLE CRYSTALS; ULTRATHIN FILMS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACE PROPERTIES; METAL OXIDE INTERFACES;

OXIDE FILMS;

EID: 34548658850     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.04.137     Document Type: Article

References (22)

1. Altieri S., Tjeng L.H., and Sawatzky G.A. Thin Solid Films 400 (2001) 9
2. Ferrari A.M. Surf. Sci. 584 (2005) 269
3. Altieri S., Tjeng L.H., Voogt F.C., Hibma T., and Sawatzky G.A. Phys. Rev. B 59 (1999) R2517
4. Altieri S., Tjeng L.H., Voogt F.C., Hibma T., Rogojanu O., and Sawatzky G.A. Phys. Rev. B 66 (2002) 1554321
5. de Masi R., Reinicke D., Müller F., Steiner P., and Hüfner S. Surf. Sci. 515 (2002) 523
6. Regan T.J., Ohldag H., Stamm C., Nolting F., Lüning J., Stöhr J., and White R.L. Phys. Rev. B 64 (2001) 2144221
7. Benedetti S., Luches P., Liberati M., and Valeri S. Surf. Sci. 572 (2004) L348
8. Nagel M., Zhang L., Peisert H., and Chassé T. Microchim. Acta 156 (2007) 27
9. Krasnikov S.A., Vinogradov A.S., Hallmeier K.-H., Höhne R., Ziese M., Esquinazi P., Chassé T., and Szargan R. Mater. Sci. Eng. B 109 (2004) 207
10. Haverkort M.W., Csiszar S.I., Hu Z., Altieri S., Tanaka A., Hsieh H.H., Lin H.-J., Chen C.T., Hibma T., and Tjeng L.H. Phys. Rev. B 69 (2004) 0204081
11. Sindhu S., Heiler M., Schindler K.-M., Widdra W., and Neddermeyer H.J. Surf. Sci. 566-568 (2004) 471
12. Franchini C., Bayer V., Podloucky R., Parteder G., Surnev S., and Netzer F.P. Phys. Rev. B 73 (2006) 155402
13. Rizzi G.A., Petukhov M., Sambi M., Zanoni R., Perriello L., and Granozzi G. Surf. Sci. 482-485 (2001) 1474
14. Li H., Quinn J., Li Y.S., Tian D., and Jona F. Phys. Rev. B 43 (1991) 7305
15. Müller F., de Masi R., Reinicke D., Steiner P., Hüfner S., and Stöwe K. Surf. Sci. 520 (2002) 158
16. de Groot F. Chem. Rev. 101 (2001) 1779
17. Cowan R.D. J. Opt. Soc. Am. 58 (1968) 808
18. Butler P.H., and Wybourne B.G. Int. J. Quantum Chem. 10 (1976) 581
19. de Groot F.M.F. J. Electron Spectr. 67 (1994) 529
20. M. Nagel, I. Biswas, P. Nagel, E. Pellegrin, S. Schuppler, H. Peisert, T. Chassé, Phys. Rev. B, accepted for publication.
21. Hesse R., Chassé T., Streubel P., and Szargan R. Surf. Interface Anal. 36 (2004) 1373
22. Parmigiani F., and Sangaletti L. J. Electron Spectrosc. Relat. Phenom. 98-99 (1999) 287