Epitaxial growth of MnO/Ag( 0 0 1) films

Surface Science

Volumn 520, Issue 3, 2002, Pages 158-172

  Muller F ^a   De Masi, R ^a   Reinicke, D ^a   Steiner, P ^a   Hufner S ^a   Stowe K ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

Epitaxy; Growth; Low energy electron diffraction (LEED); Manganese; Photoelectron diffraction; Reflection spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; CRYSTALLINE MATERIALS; ELECTRONS; EPITAXIAL GROWTH; GROUND STATE; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; SEMICONDUCTING MANGANESE COMPOUNDS; SILVER; X RAY PHOTOELECTRON SPECTROSCOPY;

REFLECTION SPECTROSCOPY;

SURFACE REACTIONS;

EID: 0037153664     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02268-9     Document Type: Article

References (32)

1. Schuller I.K. Phys. Rev. Lett. 44:1980;1597.
2. Prinz G., Hathaway K. Phys. Today. 48:1995;24.
3. Dax M. Semicond. Int. 20:1997;84.
4. Henrich V.E., Cox P.A. The Surface Science of Metal Oxides. 1996;Cambridge University Press.
5. Müller F., de Masi R., Steiner P., Reinicke D., Stadtfeld M., Hüfner S. Surf. Sci. 459:2000;161-172.
6. Saiki R.S., Kaduwela A.P., Osterwalder J., Fadley C.S., Brundle C.R. Phys. Rev. B. 40:1989;1586.
7. Marre K., Neddermeier H. Surf. Sci. 287/288:1993;995.
8. Bäumer M., Cappus D., Kuhlenbeck H., Freund H.-J., Wilhelmi G., Brodde A., Neddermeier H. Surf. Sci. 253:1991;116-128.
9. Pearson W.B. A Handbook of Lattice Spacings and Structures of Metals and Alloys. 1958;Pergamon Press, New York.
10. Müller F., Steiner P., Straub Th., Reinicke D., Palm S., de Masi R., Hüfner S. Surf. Sci. 442:1999;485-497.
11. F. Müller, Dissertation, Universität des Saarlandes, 2001.
12. Th. Straub, Dissertation, Universität des Saarlandes, 1998.
13. Vicente Alvarez M.A., Zampieri G., Reinicke D., Müller F., Steiner P., Hüfner S. Phys. Rev. B. 60:1999;4952.
14. Galasso F.S. Structure and Properties of Inorganic Solids. first ed. 1970;Pergamon Press.
15. Van Vleck J.W. Phys. Rev. 45:1934;405.
16. Poon H.C., Tong S.Y. Phys. Rev. B. 30:1984;6211.
17. C.S. Fadley, in: S.G. Davison (Ed.), Progress in Surface Science, vol. 16, Pergamon, New York, 1984, p. 275.
18. Van Elp J., Potze R.H., Eskes H., Berger R., Sawatzky G.A. Phys. Rev. B. 44:1991;1530-1537.
19. Park J., Ryu S., Han M., Oh S.-J. Phys. Rev. B. 37:1988;10867.
20. Oku M., Hirokawa K., Ikeda S. J. Electron Spectrosc. 7:1977;465.
21. S. Uhlenbrock, Dissertation, Universität Osnabrück, 1994.
22. Parmigiani F., Sangaletti L. J. Electron Spectrosc. 98-99:1999;287-302.
23. Lad R.J., Henrich V.E. Phys. Rev. B. 38:1988;10860.
24. Petkova A., Wollschläger J., Günter H.-L., Henzler M. Surf. Sci. 482-485:2001;922.
25. Kiessig H. Ann. Phys. 10:1931;769.
26. Parrat L.G. Phys. Rev. 95:1954;359.
27. ANALYZE, RayfleX program package, V. 2.25, 1993-99, Seifert.
28. Steiner P., Zimmermann R., Reinert F., Engel Th., Hüfner S. Z. Phys. B. 99:1996;479-490.
29. Foord J.S., Jackmann R.B., Allen G.C. Philos. Mag. A. 49:1984;657.
30. Carver J.C., Schweitzer G.K., Carlson T.A. J. Chem. Phys. 57:1972;973.
31. Zhong Zhao L., Young V. J. Electron Spectrosc. Relat. Phenom. 34:1984;45.
32. DiCastro V., Polzonetti G. J. Electron Spectrosc. Relat. Phenom. 48:1989;117-123.