Dependence of the microstructural properties on the substrate temperature in strained CdTe (1 0 0)/GaAs (1 0 0) heterostructures

Applied Surface Science

Volumn 253, Issue 20, 2007, Pages 8470-8473

  Lee, K H ^a   Jung, J H ^b   Kim, T W ^b   Lee, H S ^c   Park, H L ^c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Hanyang University   (South Korea)

^c Yonsei University   (South Korea)

Author keywords

Atomic arrangement; CdTe GaAs heterostructure; Microstructural properties

Indexed keywords

CADMIUM COMPOUNDS; ELECTRON DIFFRACTION; LATTICE CONSTANTS; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC ARRANGEMENT; CRYSTALLINITY; MICROSTRUCTURAL PROPERTIES; SUBSTRATE TEMPERATURE;

HETEROJUNCTIONS;

EID: 34548527138     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.04.019     Document Type: Article

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