SCOPUS 정보 검색 플랫폼

Volumn 91, Issue 10, 2007, Pages

Influence of elastic scattering of photoelectrons on angle-resolved x-ray photoelectron spectroscopy

b IMEC (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; ELASTIC SCATTERING; ELECTRON EMISSION; PHASE COMPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGULAR DEPENDENCES; COMPOSITION DEPTH; EMISSION ANGLES; HIGH-RESOLUTION RUTHERFORD BACKSCATTERING SPECTROSCOPY;

PHOTOELECTRONS;

EID: 34548514420 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2772769 Document Type: Article

Times cited : (16)

References (11)

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