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Applied Physics Letters

Volumn 91, Issue 10, 2007, Pages

Fabrication and characterization of "on-edge" molecular junctions for molecular electronics

(3) Shamai, T a Ophir, A a Selzer, Y a

a TEL AVIV UNIVERSITY (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; METALLIC FILMS; MICROSTRUCTURE; MOLECULAR ELECTRONICS; MOLECULAR STRUCTURE; PHOTOLITHOGRAPHY;

MOLECULAR JUNCTIONS; MOLECULAR LAYER; SAM-METAL;

SEMICONDUCTOR JUNCTIONS;

EID: 34548508947 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2780057 Document Type: Article

Times cited : (10)

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