Interpretation of stochastic events in single molecule conductance measurements

Nano Letters

Volumn 6, Issue 10, 2006, Pages 2362-2367

  Jang, Sung Yeon ^a,b   Reddy, Pramod ^c   Majumdar, Arun ^b,c   Segalman, Rachel A ^a,b  

^a University of California   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1,10-DECANEDITHOL (DDT); LAST STEP ANALYSIS (LSA); METAL MOLECULE JUNCTIONS; TUNNELING CURRENTS;

ELECTRIC CONDUCTANCE; RANDOM PROCESSES; SCANNING TUNNELING MICROSCOPY;

PARAFFINS;

ALKANE;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; GENETIC PROCEDURES; METHODOLOGY; SCANNING TUNNELING MICROSCOPY; STATISTICAL MODEL; STATISTICS;

ALKANES; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MICROSCOPY, SCANNING TUNNELING; MODELS, CHEMICAL; MODELS, MOLECULAR; MODELS, STATISTICAL; MOLECULAR PROBE TECHNIQUES; STOCHASTIC PROCESSES;

EID: 33750512351     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0609495     Document Type: Article

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