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Volumn 463-465, Issue SUPPL., 2007, Pages 885-890

Statistical analysis of scatter in critical current of bent superconducting Bi2223 composite tape

Author keywords

Bending; Bi2223 composite tape; Critical current; Statistical analysis

Indexed keywords

BENDING (DEFORMATION); CRITICAL CURRENTS; DAMAGE DETECTION; DISTRIBUTION FUNCTIONS; SUPERCONDUCTING CABLES; WEIBULL DISTRIBUTION;

EID: 34548438574     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2006.12.021     Document Type: Article
Times cited : (10)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.