Critical current degradation behaviour in Bi-2223 superconducting tapes under bending and torsion strains

Superconductor Science and Technology

Volumn 16, Issue 9, 2003, Pages 1012-1018

  Shin, Hyung Seop ^a   Katagiri, Kazumune ^b  

^a Andong National University   (South Korea)

^b IWATE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); BISMUTH; CRACK PROPAGATION; CRITICAL CURRENTS; DEGRADATION; ELECTRIC POTENTIAL; SILVER ALLOYS; STRAIN; TORSIONAL STRESS;

TORSION STRAINS;

SUPERCONDUCTING TAPES;

EID: 0141608167     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/16/9/309     Document Type: Conference Paper

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