Local variations in the critical current degradation of Ag/Bi2223 tape by tensile and bending strains

Superconductor Science and Technology

Volumn 16, Issue 9, 2003, Pages 995-999

  Katagiri, K ^a   Shin, H S ^b   Kasaba, K ^a   Tsukinokizawa, T ^a   Hiroi, K ^a   Kuroda, T ^c   Itoh, K ^c   Wada, H ^c  

^a IWATE UNIVERSITY   (Japan)

^b Andong National University   (South Korea)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); BISMUTH; CRITICAL CURRENTS; DEGRADATION; SILVER; STRAIN; TENSILE TESTING;

STRAIN DISTRIBUTION;

SUPERCONDUCTING TAPES;

EID: 0141717924     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/16/9/306     Document Type: Conference Paper

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