SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Electronic Materials

Volumn 36, Issue 9, 2007, Pages 1111-1120

Damage produced in solder alloys during thermal cycling

(2) Liu, X W a Plumbridge, W J b

a UNIVERSITY OF HERTFORDSHIRE (United Kingdom)

b OPEN UNIVERSITY (United Kingdom)

Author keywords

Anisotropy of tin; Cracks; Fatigue; Lead free solders; Thermal cycling

Indexed keywords

DAMAGE ACCUMULATION; FREESTANDING SAMPLES; LEAD-FREE SOLDERS;

CRACKS; DAMAGE DETECTION; OPTICAL ANISOTROPY; STRAIN RATE; STRUCTURAL INTEGRITY; THERMAL CYCLING;

SOLDERING ALLOYS;

EID: 34548232313 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-007-0122-8 Document Type: Article

Times cited : (16)

References (20)

1
- 0020903074
- P.M. Hall, T.D. Dudderar, J.F. Argyle, IEEE Trans. Compon. Hybrids Manuf. Technol. 6, 544 (1983)
- (1983) IEEE Trans. Compon. Hybrids Manuf. Technol. , vol.6 , pp. 544
- Hall, P.M.¹ Dudderar, T.D.² Argyle, J.F.³

2
- 0142167353
- X.W. Liu, W.J. Plumbridge, Mater. Sci. Eng. A 362, 309 (2003)
- (2003) Mater. Sci. Eng. A , vol.362 , pp. 309
- Liu, X.W.¹ Plumbridge, W.J.²

3
- 34548289890
- H.D. Solomon, IEEE CHMT 9, 423 (1986)
- (1986) IEEE CHMT , vol.9 , pp. 423
- Solomon, H.D.¹

4
- 0024887607
- N.F. Enke, T.J. Kilinski, S.A. Schroeder, J.R. Lesniak, IEEE CHMT 12, 459 (1989)
- (1989) IEEE CHMT , vol.12 , pp. 459
- Enke, N.F.¹ Kilinski, T.J.² Schroeder, S.A.³ Lesniak, J.R.⁴

5
- 0142192603
- ed. J.H. Lau (New York: Van Nostrand Reinhold)
- S. Vaynman, and M.E. Fine, in Solder Joint Reliability, ed. J.H. Lau (New York: Van Nostrand Reinhold, 1991), pp. 334-360
- (1991) Solder Joint Reliability , pp. 334-360
- Vaynman, S.¹ Fine, M.E.²

6
- 0030384213
- H. Jiang, R. Hermann, W.J. Plumbridge, J. Mater. Sci. 31, 6455 (1996)
- (1996) J. Mater. Sci. , vol.31 , pp. 6455
- Jiang, H.¹ Hermann, R.² Plumbridge, W.J.³

7
- 0030687350
- Anaheim, CA: Reed Exhibition Companies
- J. Chin, H. Mavoori, M.E. Fine, B. Moran, and L.M. Keer, NEPCON WEST 97 Conf. (Anaheim, CA: Reed Exhibition Companies, 1997), pp 15-23
- (1997) NEPCON WEST 97 Conf. , pp. 15-23
- Chin, J.¹ Mavoori, H.² Fine, M.E.³ Moran, B.⁴ Keer, L.M.⁵

8
- 0033361821
- H. Conrad, Z. Guo, Y. Fahmy, D. Yang, J. Electron. Mater. 28, 1062 (1999)
- (1999) J. Electron. Mater. , vol.28 , pp. 1062
- Conrad, H.¹ Guo, Z.² Fahmy, Y.³ Yang, D.⁴

9
- 0021651241
- P.M. Hall, IEEE Trans. Comp. Hybrids Manuf. Technol. 7, 314 (1984)
- (1984) IEEE Trans. Comp. Hybrids Manuf. Technol. , vol.7 , pp. 314
- Hall, P.M.¹

10
- 0000619691
- Q. Guo, E.C. Cutiongco, L.M. Keer, M.E. Fine, J. Electron. Packag. 114, 145 (1992)
- (1992) J. Electron. Packag. , vol.114 , pp. 145
- Guo, Q.¹ Cutiongco, E.C.² Keer, L.M.³ Fine, M.E.⁴

11
- 0027609085
- P. Hacke, A.F. Sprecher, H. Conrad, J. Electron. Packag. 115, 153 (1993)
- (1993) J. Electron. Packag. , vol.115 , pp. 153
- Hacke, P.¹ Sprecher, A.F.² Conrad, H.³

12
- 0028459971
- R.G. Ross Jr., J. Electron. Packag. 116, 69 (1994)
- (1994) J. Electron. Packag. , vol.116 , pp. 69
- Ross Jr., R.G.¹

13
- 0028738024
- Fatigue of electronic materials
- ed. S.A. Schroeder (Philadelphia)
- Y.H. Pao, S. Badgley, R. Govila, and E. Jih, Fatigue of Electronic Materials, ASTM STP 1153, ed. S.A. Schroeder (Philadelphia, 1994), pp. 60-81
- (1994) ASTM STP , vol.1153 , pp. 60-81
- Pao, Y.H.¹ Badgley, S.² Govila, R.³ Jih, E.⁴

14
- 0033362597
- C.H. Raeder, R.W. Messler, L.F. Coffin Jr., J. Electron. Mater. 28, 1045 (1999)
- (1999) J. Electron. Mater. , vol.28 , pp. 1045
- Raeder, C.H.¹ Messler, R.W.² Coffin Jr., L.F.³

15
- 0036867034
- J.G. Lee, A. Telang, K.N. Subramanian, T.R. Bieler, J. Electron. Mater. 31, 1152 (2002)
- (2002) J. Electron. Mater. , vol.31 , pp. 1152
- Lee, J.G.¹ Telang, A.² Subramanian, K.N.³ Bieler, T.R.⁴

16
- 27144558671
- F. Guo, J.G. Lee, T.P. Hogan, K.N. Subramanian, J. Mater. Res. 20, 364 (2005)
- (2005) J. Mater. Res. , vol.20 , pp. 364
- Guo, F.¹ Lee, J.G.² Hogan, T.P.³ Subramanian, K.N.⁴

17
- 1542397798
- K.N. Subramanian, J.G. Lee, J. Mater. Sci.: Mater. Electron. 15, 235 (2004)
- (2004) J. Mater. Sci.: Mater. Electron. , vol.15 , pp. 235
- Subramanian, K.N.¹ Lee, J.G.²

18
- 3242771396
- W.J. Plumbridge, Y. Kariya, Fatigue Fract. Eng. Mater. Struct. 27, 723 (2004)
- (2004) Fatigue Fract. Eng. Mater. Struct. , vol.27 , pp. 723
- Plumbridge, W.J.¹ Kariya, Y.²

19
- 34548216317
- ed. J.R. Davis (Materials Park, OH: ASM International)
- Metals Handbook, 2nd ed., ed. J.R. Davis (Materials Park, OH: ASM International, 1998), p. 94
- (1998) Metals Handbook, 2nd Ed. , pp. 94

20
- 0035359283
- Y. Kariya, N. Williams, C.R. Gagg, W.J. Plumbridge, J. Mater. 53, 39 (2001)
- (2001) J. Mater. , vol.53 , pp. 39
- Kariya, Y.¹ Williams, N.² Gagg, C.R.³ Plumbridge, W.J.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.