Identification of in-field defect development in digital image sensors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6502, Issue , 2007, Pages

  Dudas, Jozsef ^a   Wu, Linda M ^a   Jung, Cory ^a   Chapman, Glenn H ^a   Koren, Zahava ^b   Koren, Israel ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b University of Massachusetts   (United States)

Author keywords

Active pixel sensor; APS; CMOS image sensor; Fault tolerance; Hot pixel; Imager defects; Imager fault detection

Indexed keywords

ADAPTIVE ALGORITHMS; CMOS INTEGRATED CIRCUITS; DIGITAL CAMERAS; FAULT TOLERANCE; PIXELS;

ACTIVE PIXEL SENSORS; CMOS IMAGE SENSORS; HOT PIXELS; IMAGER DEFECTS; IMAGER FAULT DETECTION;

IMAGE SENSORS;

EID: 34548209171     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.704563     Document Type: Conference Paper

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