Robust detection of defects in imaging arrays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6059, Issue , 2006, Pages

  Dudas, Jozsef ^a   Jung, Cory ^a   Chapman, Glenn H ^a   Koren, Zahava ^b   Koren, Israel ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b University of Massachusetts   (United States)

Author keywords

Active pixel sensor; APS; CMOS image sensor; Fault tolerance; Imager fault detection

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; DENSITY (OPTICAL); FAULT TOLERANT COMPUTER SYSTEMS; IMAGE QUALITY; IMAGING SYSTEMS; MAXIMUM LIKELIHOOD ESTIMATION; MONTE CARLO METHODS; OPTICAL RESOLVING POWER; ROBUSTNESS (CONTROL SYSTEMS);

ACTIVE PIXEL SENSOR (APS); CMOS IMAGE SENSOR; IMAGER FAULT DETECTION; PICTURE ELEMENTS (PIXELS);

IMAGE SENSORS;

EID: 33645520023     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.643452     Document Type: Conference Paper

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