On-line mapping of in-field defects in image sensor arrays

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2006, Pages 439-447

  Dudas, Jozsef ^a   Jung, Cory ^a   Wu, Linda ^a   Chapman, Glenn H ^a   Koren, Israel ^b   Koren, Zahava ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b University of Massachusetts   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLOR IMAGERS; DEFECT GROWTH; DIGITAL IMAGE SENSORS;

CAMERAS; DEFECTS; IMAGE ANALYSIS; MATHEMATICAL MODELS; PHOTOGRAPHY; PROBLEM SOLVING; SENSOR ARRAYS;

IMAGE SENSORS;

EID: 34548231472     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2006.48     Document Type: Conference Paper

References (6)

1. J. Dudas, C. Jung, G. Chapman, I. Koren, and Z. Koren, "Robust Detection of Defects in Imaging Arrays," Proc. SPIE Int. Soc. Opt. Eng, 6059, Luke C. Cui, Yoichi Miyake, Jan. 2006.
2. Y. Tan and T. Acharya, "A Robust Sequential Approach for the Detection of Defective Pixels in an Image Sensor," IEEE Intl. Conf. Acoustics, Speech and Signal Processing, vol. 4, pp. 2239-2242, Phoenix, AR, Mar. 1999.
3. B. Jin, N. Park, K. M. George, M. Choi, and M.B. Yeary, "Modeling and Analysis of Soft-Test/Repair for CCD-Based Digital X-Ray Systems," IEEE Trans. Instrumentation and Measurement, vol. 52, pp. 1712-1721, Dec. 2003.
4. G. Chapman, I. Koren, Z. Koren, J. Dudas, and C. Jung, "On-Line Detection of Faults in Fault-Tolerant Imagers," Proc. of the 2005 Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 149-157, Monterey, CA, Oct. 2005.
5. B. E. Bayer, "Colour Imaging Array," U. S. Patent 3,971,065, July 1976.
6. P. Askey, "Canon EOS 350D / Digital Rebel XT / Kiss n Digital Review," Digital Photography Review, April 2005. Accessed at http://www.dpreview.com/reviews/canoneos350d/, May 24, 2006.