On-Line identification of faults in fault-tolerant imagers

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2005, Pages 149-157

  Chapman, Glenn H ^a   Koren, Israel ^b   Koren, Zahava ^b   Dudas, Jozsef ^a   Jung, Cory ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

^b University of Massachusetts   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE PIXEL SENSORS (APS); FAULTY PIXELS; HIGH-RESOLUTION SENSORS;

ALGORITHMS; COMPUTER SIMULATION; FAULT TOLERANT COMPUTER SYSTEMS; IDENTIFICATION (CONTROL SYSTEMS); MATHEMATICAL MODELS; ONLINE SEARCHING; STATISTICAL METHODS;

IMAGE SENSORS;

EID: 28444480175     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. G.H. Chapman and Y. Audet, "Creating 35 mm Camera Active Pixel Sensors," Proc. of the 1999 Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 22-30, Albuquerque, NM, Nov. 1999.
2. Y. Audet and G.H. Chapman, "Design of a Self-Correcting Active Pixel Sensor," Proc. of the 2001 Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 18-27, San Francisco, CA, Oct. 2001.
3. I. Koren, G.H. Chapman, and Z. Koren, "A Self-Correcting Active Pixel Camera," Proc. of the 2000 Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 56-64, Yamanashi, Japan, Oct. 2000.
4. I. Koren, G. Chapman, and Z. Koren, "Advanced Fault-Tolerance Techniques For A Color Digital Camera-On-A-Chip," Proc. of the 2001 Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 3-10, San Francisco, CA, Oct. 2001.
5. G. Chapman, Y.Audet, I. Koren, Z. Koren, S. Djaja, D. Cheung, "A Self-Correcting Active Pixel Sensor using Hardware and Software Correction," IEEE Design & Test of Computers, pp. 544-551, Nov. 2004.
6. B. Jin, N. Park, K. M. George, M. Choi, and M. B. Yeary, "Modeling and Analysis of Soft-Test/Repair for CCD-Based Digital X-Ray Systems," IEEE Trans. Instrumentation and Measurement, vol.52, pp. 1712-1721, Dec. 2003.
7. Y. Tan and T. Acharya, "A Robust Sequential Approach for the Detection of Defective Pixels in an Image Sensor," IEEE Intl. Conf. Acoustics, Speech and Signal Processing, vol. 4, pp. 2239-2242, Phoenix, AR, Mar. 1999.