Raman spectroscopy of nanocrystalline ceria and zirconia thin films

Journal of the American Ceramic Society

Volumn 85, Issue 11, 2002, Pages 2646-2650

  Kosacki, Igor ^a   Petrovsky, Vladimir ^a   Anderson, Harlan U ^a   Colomban, Philippe ^b  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; ELECTRIC CONDUCTIVITY; ELECTRON MICROSCOPY; GRAIN SIZE AND SHAPE; IONIC CONDUCTION IN SOLIDS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CERIA; CRYSTALLINITY; NONSTOICHIOMETRY; YTTRIA STABILIZED ZIRCONIA;

ZIRCONIA;

EID: 0036864637     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2002.tb00509.x     Document Type: Article

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