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Volumn , Issue , 2007, Pages 513-518

Achieving low-cost linearity test and diagnosis of EA ADCs via frequency-domain nonlinear analysis and macromodeling

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; COMPUTER SIMULATION; COST EFFECTIVENESS; FREQUENCY DOMAIN ANALYSIS; SIGNAL ANALYSIS;

EID: 34548127974     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2007.28     Document Type: Conference Paper
Times cited : (2)

References (14)
  • 1
    • 0034476235 scopus 로고    scopus 로고
    • Optimal INL/DNL testing of A/D converters using a linear model
    • Oct
    • S. Cherubal and A. Chatterjee. Optimal INL/DNL testing of A/D converters using a linear model. In IEEE Int. Test Conf., pages 358-366, Oct. 2000.
    • (2000) IEEE Int. Test Conf , pp. 358-366
    • Cherubal, S.1    Chatterjee, A.2
  • 2
    • 0032183635 scopus 로고    scopus 로고
    • A tutorial introduction to research on analog and mixed-signal circuit testing
    • Oct
    • L. S. Milor. A tutorial introduction to research on analog and mixed-signal circuit testing. IEEE Trans. Circuits Syst. - II, 45(10):1389-1407, Oct. 1998.
    • (1998) IEEE Trans. Circuits Syst. - II , vol.45 , Issue.10 , pp. 1389-1407
    • Milor, L.S.1
  • 3
    • 0030686016 scopus 로고    scopus 로고
    • Efficient and accurate testing of analog-to-digital converters using oscillation-test method
    • Mar
    • K. Arabi and B. Kaminska. Efficient and accurate testing of analog-to-digital converters using oscillation-test method. In IEEE European Design and Test Conf., pages 348-352, Mar. 1997.
    • (1997) IEEE European Design and Test Conf , pp. 348-352
    • Arabi, K.1    Kaminska, B.2
  • 4
    • 0031382734 scopus 로고    scopus 로고
    • The use of linear models in A/D converter testing
    • Dec
    • P. D. Capofreddi and B. A. Wooley. The use of linear models in A/D converter testing. IEEE Trans. Circuits Syst. - I, 44(12):1105-1113, Dec. 1997.
    • (1997) IEEE Trans. Circuits Syst. - I , vol.44 , Issue.12 , pp. 1105-1113
    • Capofreddi, P.D.1    Wooley, B.A.2
  • 5
    • 34548119702 scopus 로고    scopus 로고
    • B. Kim, H. Shin, J. Chun, and TITLE = J. Abraham.
    • B. Kim, H. Shin, J. Chun, and TITLE = J. Abraham.
  • 6
    • 0033353554 scopus 로고    scopus 로고
    • Estimating the integral non-linearity of AD-converters via the frequency domain
    • Atlantic City, NJ, Sep
    • N. Csizmadia and A.J.E.M. Janssen. Estimating the integral non-linearity of AD-converters via the frequency domain. In IEEE Int. Test Conf., pages 757-762. Atlantic City, NJ, Sep. 1999.
    • (1999) IEEE Int. Test Conf , pp. 757-762
    • Csizmadia, N.1    Janssen, A.J.E.M.2
  • 11
    • 34548132266 scopus 로고    scopus 로고
    • INL/DNL measurements for high-speed analog-to-digital converters ADCs
    • Sep
    • _. INL/DNL measurements for high-speed analog-to-digital converters ADCs. In Maxim Integrated Products Application Note 283, pages 1-9, Sep. 2000.
    • (2000) Maxim Integrated Products Application Note , vol.283 , pp. 1-9
    • Wambacq, P.1    Sansen, W.2
  • 12
    • 34547095362 scopus 로고    scopus 로고
    • Lookup table based simulation and statistical modeling of sigma-delta ADCs
    • July
    • G. Yu and P. Li. Lookup table based simulation and statistical modeling of sigma-delta ADCs. In Proc. of IEEE/ACM Design Automation Conference, pages 1035-1040, July 2006.
    • (2006) Proc. of IEEE/ACM Design Automation Conference , pp. 1035-1040
    • Yu, G.1    Li, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.