The use of linear models in a/d converter testing

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 44, Issue 12, 1997, Pages 1105-1113

  Capofreddi, Peter D ^a   Wooley, Bruce A ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

Analog digital conversion; Integrated circuit testing; Modeling; Statistics

Indexed keywords

INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS;

CODE DENSITY METHOD; LINEAR MODELS; SERVO LOOP METHOD; TALLY AND WEIGHT METHOD;

ANALOG TO DIGITAL CONVERSION;

EID: 0031382734     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.645145     Document Type: Article

References (19)

1. T. M. Souders and G. N. Stenbakken, "A comprehensive approach for modeling and testing analog and mixed-signal devices," in IEEE Int. Test Conf., Washington, DC, Sept. 1990, pp. 169-176.
2. G. N. Stenbakken and T. M. Souders, "Linear error modeling of analog and mixed-signal devices," in IEEE Int. Test Conf., Nashville, TN, Oct. 1991, pp. 573-581.
3. _, "Developing linear error models for analog devices," IEEE Trans. Instrum. Meas., vol. 43, pp. 157-163, Apr. 1994.
4. _, "Test point selection and testability measures via QR factorization of linear models," IEEE Trans. Instrum. Meas., vol. IM-36, pp. 40610, June 1987.
5. M. Mahoney, DSP-Based Testing of Analog and Mixed Signal Circuits. Washington, DC: IEEE Comp. Soc. Press, 1987, pp. 133-154.
6. J. Doernberg, H. Lee, and D. Hodges, "Full-speed testing of A/D converters," IEEE J. Solid-State Circuits, vol. SC-19, pp. 820-827, Dec. 1984.
7. G. H. Golub and C. F. Van Loan, Matrix Computations. Baltimore, MD: Johns Hopkins Press, 1989, pp. 225-226; 427-437.
8. T. W. Anderson, An Introduction to Multivariate Statistical Analysis. New York: Wiley, 1984, pp. 166-167; 451-477.
9. E. Liu, G. Gielen, H. Chang, A. L. Sangiovanni-Vincentelli, and P. R. Gray, "Behavioral modeling and simulation of data converters," in IEEE Int. Symp. Circuits Syst., San Diego, CA, May 1992, pp. 2144-2147.
10. E. R. Hnatek, Digital Integrated Circuit Testing from a Quality Perspective. New York: Van Nostrand, 1993.
11. J. T. G. Hwang and H.-K. Liu, "Asymptotic theory for prediction through empirical linear models," in Spring Res. Conf.: ASA 1994 Proc., (American Statistical Assoc.), Chapel Hill, NC, June 1994, pp. 207-216.
12. _, "Application of empirical linear prediction to quality assurance in industrial manufacturing," in Physical Eng. Sci.: Proc. 1994 Joint Statistical Meetings, (American Statistical Assoc.), Toronto, Ont., Canada, Aug. 1994, pp. 175-180.
13. G. N. Stenbakken, "Effects of nonmodel error on model-based testing," in IEEE Proc. Int. Measurement Technol. Conf., Waltham, MA, Apr. 1995, pp. 38-42.
14. J. A. Connelly and K. P. Taylor, "An analysis methodology to identify dominant noise sources in D/A and A/D converters," IEEE Trans. Circuits Syst., vol. 38, pp. 1133-1144, Oct. 1991.
15. E. L. Lehmann, Testing Statistical Hypotheses. New York: Chapman & Hall, 1986, pp. 192-197; 432.
16. S. Max, "Fast, accurate and complete ADC testing," in IEEE Int. Test Conf., Washington, DC, Aug. 1989, pp. 111-117.
17. J. S. Williams, "A confidence interval for variance components," Biometrika, vol. 49 pp. 278-281, 1962.
18. B. L. Welch, "The generalization of student's problem when several variances are involved," Biometrika, vol. 34 pp. 28-35, 1947.
19. MATLAB Users' Guide. Natick, MA: The Math Works, 1992.