메뉴 건너뛰기




Volumn , Issue , 2006, Pages 1035-1040

Lookup table based simulation and statistical modeling of Sigma-Delta ADCs

Author keywords

Lookup table; Sigma Delta; Statistical modeling

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; NETWORKS (CIRCUITS); PARAMETER ESTIMATION; PROGRAM PROCESSORS; STATISTICAL METHODS; TRANSISTORS;

EID: 34547095362     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1146909.1147169     Document Type: Conference Paper
Times cited : (6)

References (13)
  • 6
    • 0020180895 scopus 로고
    • CAzM: A circuit analyzer with macromodeling
    • September
    • W.M. Goughran, E. Grosse, and D.J. Rose. CAzM: A circuit analyzer with macromodeling. IEEE Trans. Electron Devices, 30(9):1207-1213, September 1983.
    • (1983) IEEE Trans. Electron Devices , vol.30 , Issue.9 , pp. 1207-1213
    • Goughran, W.M.1    Grosse, E.2    Rose, D.J.3
  • 10
    • 0024931842 scopus 로고
    • An efficient methodology for building macromodels of IC fabrication processes
    • December
    • K. K. Low and Stephen W. Director. An efficient methodology for building macromodels of IC fabrication processes. IEEE Trans. Computer-Aided Design, 8(12):1299-1313, December 1989.
    • (1989) IEEE Trans. Computer-Aided Design , vol.8 , Issue.12 , pp. 1299-1313
    • Low, K.K.1    Director, S.W.2
  • 12
    • 0034476235 scopus 로고    scopus 로고
    • Optimal INL/DNL testing of A/D converters using a linear model
    • October
    • S. Cherubal and A. Chatterjee. Optimal INL/DNL testing of A/D converters using a linear model. In IEEE Int. Test Conf., pages 358-366, October 2000.
    • (2000) IEEE Int. Test Conf , pp. 358-366
    • Cherubal, S.1    Chatterjee, A.2
  • 13
    • 0033353554 scopus 로고    scopus 로고
    • Estimating the integral non-linearity of AD-converters via the frequency domain
    • Atlantic City, NJ, September
    • Nico Csizmadia and A.J.E.M. Janssen. Estimating the integral non-linearity of AD-converters via the frequency domain. In IEEE Int. Test Conf., pages 757-762. Atlantic City, NJ, September 1999.
    • (1999) IEEE Int. Test Conf , pp. 757-762
    • Csizmadia, N.1    Janssen, A.J.E.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.