Rapid structural and chemical characterization of ternary phase diagrams using synchrotron radiation

Journal of Materials Research

Volumn 18, Issue 10, 2003, Pages 2522-2527

  Specht, E D ^a   Rar, A ^a,b   Pharr, G M ^a,b   George, E P ^a,b   Zschack, P ^c   Hong, H ^c   Ilavsky, J ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee Knoxville   (United States)

^c University of Illinois at Urbana Champaign   (United States)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; CRYSTALLOGRAPHY; FLUORESCENCE; SAPPHIRE; SYNCHROTRON RADIATION;

RASTERING;

TERNARY SYSTEMS;

EID: 0242491716     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2003.0351     Document Type: Article

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