Electrical characterization of SnO2: Sb ultrathin films obtained by controlled thickness deposition

Journal of Applied Physics

Volumn 102, Issue 3, 2007, Pages

  Giraldi, Tania R ^a   Lanfredi, Alexandre J C ^a   Leite, Edson R ^a   Escote, Marcia T ^b   Longo, Elson ^c   Varela, Joś A ^c   Ribeiro, Caue ^d   Chiquito, Adenilson J ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b UNIVERSIDADE FEDERAL DO ABC   (Brazil)

^c SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^d EMBRAPA CERRADOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; FILM THICKNESS; SEMICONDUCTOR DEVICES; TIN COMPOUNDS;

CRYSTALLINE OXIDES; INTERMEDIARY SYSTEMS;

ULTRATHIN FILMS;

EID: 34548034240     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2764003     Document Type: Article

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