Effect of thickness on the electrical and optical properties of Sb doped SnO2 (ATO) thin films

Journal of Electroceramics

Volumn 13, Issue 1-3, 2004, Pages 159-165

  Giraldi, T R ^a   Escote, M T ^a   Bernardi, M I B ^a   Bouquet, V ^c   Leite, E R ^a   Longo, E ^a   Varela, J A ^b  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^c UNIVERSITÉ DE RENNES 1   (France)

Author keywords

Antimony; Thin film; Tin oxide

Indexed keywords

ANTIMONY; CHARACTERIZATION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY MEASUREMENT; MICROSTRUCTURE; SCANNING TUNNELING MICROSCOPY; SILICA; SPIN COATING; TIN COMPOUNDS; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

FILM THICKNESS; MICROSTRUCTURAL CHARACTERIZATION; OPTICAL CHARACTERIZATION; TIN OXIDE;

THIN FILMS;

EID: 17044434233     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10832-004-5093-z     Document Type: Conference Paper

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