Influence of metal contamination in vacuum chamber on properties of optical thin films

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 34, Issue 7, 2007, Pages 988-991

  Ling, Bo ^a   Liu, Shi Jie ^a   Yuan, Lei ^a   He, Hong Bo ^a   Fan, Zheng Xiu ^a   Shao, Jian Da ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Impurity contamination; Laser induced damage threshold; Thin films; Vacuum materials

Indexed keywords

LASER DAMAGE; OPTICAL PROPERTIES; SURFACE ANALYSIS; THIN FILMS;

IMPURITY CONTAMINATION; LASER INDUCED DAMAGE THRESHOLD (LIDT); OPTICAL THIN FILMS; VACUUM MATERIALS;

OPTICAL FILMS;

EID: 34547981170     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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