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Volumn 18, Issue 5, 2000, Pages 2372-2377

Evaporation and ion assisted deposition of HfO2 coatings: Some key points for high power laser applications

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; FILM GROWTH; HAFNIUM COMPOUNDS; LASER APPLICATIONS; LASER BEAMS; OPTICAL COATINGS; OPTICAL PROPERTIES; SILICA; STOICHIOMETRY;

EID: 0034272653     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1287153     Document Type: Article
Times cited : (61)

References (22)
  • 1
    • 0003224272 scopus 로고
    • edited by F. R. Flory Marcel Dekker, New York
    • H. A. Macleod, Thin Films for Optical Systems, edited by F. R. Flory (Marcel Dekker, New York, 1995), pp. 1-39.
    • (1995) Thin Films for Optical Systems , pp. 1-39
    • Macleod, H.A.1
  • 3
    • 57649121813 scopus 로고    scopus 로고
    • M. R. Kozlowski, in Ref. 1, pp. 521-549
    • M. R. Kozlowski, in Ref. 1, pp. 521-549.
  • 17
    • 57649126330 scopus 로고
    • Thèse de l'Institut National Polytechnique de Grenoble
    • H. Leplan, Thèse de l'Institut National Polytechnique de Grenoble, 1995.
    • (1995)
    • Leplan, H.1
  • 20
    • 0008145623 scopus 로고
    • edited by S. M. Rosnagel, J. J. Cuomo and H. R. Kaufman Noyes, Park Ridge, NJ
    • 18 edited by S. M. Rosnagel, J. J. Cuomo and H. R. Kaufman (Noyes, Park Ridge, NJ, 1989), Part 3.
    • (1989) 18 , Issue.3 PART
    • Kay, E.1    Rossnagel, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.