Morphologies of latent and etched heavy-ion tracks in {111} CaF2

Philosophical Magazine

Volumn 87, Issue 26, 2007, Pages 3967-3980

  Abu Saleh, S ^a   Eyal, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HEAVY IONS; MORPHOLOGY; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY;

ETCHING BEHAVIOR; IRRADIATED FRAGMENTS; LATENT TRACKS; PYRAMIDAL DEPRESSIONS;

CALCIUM ALLOYS;

EID: 34547944183     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701459885     Document Type: Article

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