Print your atomic force microscope

Review of Scientific Instruments

Volumn 78, Issue 7, 2007, Pages

  Kühner, Ferdinand ^a   Lugmaier, Robert A ^a   Mihatsch, Steffen ^a   Gaub, Hermann E ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; EMBEDDED SYSTEMS; IMAGING SYSTEMS; POLYMERIZATION; RAPID PROTOTYPING; SIGNAL TO NOISE RATIO;

APPLICATION-TAILORED CUSTOM INSTRUMENTS; IMAGING MODES; LIGHT DRIVEN POLYMERIZATION; SINGLE MOLECULE FORCE SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, ATOMIC FORCE; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TRANSDUCERS;

EID: 34547556487     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2751099     Document Type: Article

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