-
1
-
-
17444421512
-
-
Contreras M A, Ramanathan K, AbuShama J, Hasoon F, Young D L, Egaas B and Noufi R 2005 Prog. Photovolt. Res. Appl. 13 209-16
-
(2005)
Prog. Photovolt. Res. Appl.
, vol.13
, Issue.3
, pp. 209-216
-
-
Contreras, M.A.1
Ramanathan, K.2
Abushama, J.3
Hasoon, F.4
Young, D.L.5
Egaas, B.6
Noufi, R.7
-
2
-
-
17644437940
-
-
Klenk R, Bakehe S, Kaigawa R, Neisser A, Reiss J and Lux-Steiner M Ch 2004 Thin Solid Films 451-452 424-9
-
(2004)
Thin Solid Films
, vol.451-452
, pp. 424-429
-
-
Klenk, R.1
Bakehe, S.2
Kaigawa, R.3
Neisser, A.4
Reiss, J.5
Ch, L.M.6
-
4
-
-
0031336759
-
-
Herberholz R, Nadenau V, Rühle U, Köble C, Schock H W and Dimmler B 1997 Sol. Energy Mater. Sol. Cells 49 227-37
-
(1997)
Sol. Energy Mater. Sol. Cells
, vol.49
, Issue.1-4
, pp. 227-237
-
-
Herberholz, R.1
Nadenau, V.2
Rühle, U.3
Köble, C.4
Schock, H.W.5
Dimmler, B.6
-
6
-
-
17644439940
-
-
Schulmeyer T, Kniese R, Hunger R, Jaegermann W, Powalla M and Klein A 2004 Thin Solid Films 451-452 420-3
-
(2004)
Thin Solid Films
, vol.451-452
, pp. 420-423
-
-
Schulmeyer, T.1
Kniese, R.2
Hunger, R.3
Jaegermann, W.4
Powalla, M.5
Klein, A.6
-
12
-
-
33646553358
-
-
Theodoropoulou S, Papadimitriou D, Rega N, Siebentritt S and Lux-Steiner M Ch 2006 Thin Solid Films 511-512 690-4
-
(2006)
Thin Solid Films
, vol.511-512
, pp. 690-694
-
-
Theodoropoulou, S.1
Papadimitriou, D.2
Rega, N.3
Siebentritt, S.4
Ch, L.M.5
-
15
-
-
0035967576
-
-
Chaparro A M, Maffiotte C, Gutiérrez M T, Herrero J, Klaer J, Siemer K and Bräunig D 2001 Thin Solid Films 387 104-7
-
(2001)
Thin Solid Films
, vol.387
, Issue.1-2
, pp. 104-107
-
-
Chaparro, A.M.1
Maffiotte, C.2
Gutiérrez, M.T.3
Herrero, J.4
Klaer, J.5
Siemer, K.6
Bräunig, D.7
-
16
-
-
0032289640
-
-
Klaer J, Bruns J, Henninger R, Siemer K, Klenk R, Elimer K and Bräunig D 1998 Semicond. Sci. Technol. 13 1456-8
-
(1998)
Semicond. Sci. Technol.
, vol.13
, Issue.12
, pp. 1456-1458
-
-
Klaer, J.1
Bruns, J.2
Henninger, R.3
Siemer, K.4
Klenk, R.5
Elimer, K.6
Bräunig, D.7
-
19
-
-
0036568654
-
-
Alonso M I, Garriga M, Durante Rincón C A, Hernndez E and León M 2002 Appl. Phys. A 74 659-64
-
(2002)
Appl. Phys.
, vol.74
, Issue.5
, pp. 659-664
-
-
Alonso, M.I.1
Garriga, M.2
Durante Rincón, C.A.3
Hernndez, E.4
León, M.5
-
24
-
-
35949037328
-
-
Aspnes D E 1975 Phys. Rev. B 12 2297-310
-
(1975)
Phys. Rev.
, vol.12
, Issue.6
, pp. 2297-2310
-
-
Aspnes, D.E.1
-
25
-
-
0036531510
-
-
Kato T, Hayashi S, Kiuchi T, Ishihara Y, Nabetani Y and Matsumoto T 2002 J. Cryst. Growth 237-239 2005-8
-
(2002)
J. Cryst. Growth
, vol.237-239
, Issue.3
, pp. 2005-2008
-
-
Kato, T.1
Hayashi, S.2
Kiuchi, T.3
Ishihara, Y.4
Nabetani, Y.5
Matsumoto, T.6
-
38
-
-
0022667560
-
-
Yao T, Okada Y, Matsui S, Ishida K and Fujimoto I 1987 J. Cryst. Growth 81 518-23
-
(1987)
J. Cryst. Growth
, vol.81
, Issue.1-4
, pp. 518-523
-
-
Yao, T.1
Okada, Y.2
Matsui, S.3
Ishida, K.4
Fujimoto, I.5
-
39
-
-
0000919157
-
Thickness measurement of silicon dioxide layers by ultraviolet-visible interference method
-
Corl E A and Wimpfheimer H 1964 Thickness measurement of silicon dioxide layers by ultraviolet-visible interference method Solid-State Electronics vol 7 (Oxford: Pergamon) pp 755-61
-
(1964)
Solid-State Electronics
, vol.7
, pp. 755-761
-
-
Corl, E.A.1
Wimpfheimer, H.2
-
40
-
-
34547467148
-
-
Xue C 2003 PhD Thesis National Technical University of Athens
-
(2003)
PhD Thesis
-
-
Xue, C.1
-
41
-
-
0035106365
-
-
Alonso M I, Wakita K, Pascual J, Garriga M and Yamamoto N 2001 Phys. Rev. B 63 075203
-
(2001)
Phys. Rev.
, vol.63
, Issue.7
, pp. 075203
-
-
Alonso, M.I.1
Wakita, K.2
Pascual, J.3
Garriga, M.4
Yamamoto, N.5
|