Characterisation of CuInS2/ZnSe junctions by XPS and electroreflectance

Thin Solid Films

Volumn 387, Issue 1-2, 2001, Pages 104-107

  Chaparro, A M ^a   Maffiotte, C ^a   Gutierrez M T ^a   Herrero, J ^a   Klaer, J ^b   Siemer, K ^b   Braunig D ^b  

^a CIEMAT   (Spain)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Chemical bath deposition (CBD); CuInS2; Electroreflectance; XPS; ZnSe

Indexed keywords

COMPOSITION EFFECTS; COPPER COMPOUNDS; DEPOSITION; ELECTROOPTICAL EFFECTS; LIGHT REFLECTION; SEMICONDUCTING ZINC COMPOUNDS; STOICHIOMETRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL BATH DEPOSITION (CBD);

SEMICONDUCTOR JUNCTIONS;

EID: 0035967576     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01716-8     Document Type: Article

References (6)