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Volumn 40, Issue 12, 2007, Pages 3683-3688

Growth and characterization of ZnSxSe1-x films deposited by close-spaced evaporation

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTAL ORIENTATION; CRYSTALLIZATION; EVAPORATION; GROWTH (MATERIALS); OPACITY; POLYCRYSTALLINE MATERIALS; SPECTROPHOTOMETERS; STOICHIOMETRY; SURFACE ROUGHNESS; ZINC COMPOUNDS;

EID: 34547369097     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/12/021     Document Type: Article
Times cited : (21)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.