Fast photoluminescence imaging of silicon wafers

Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4

Volumn 1, Issue , 2006, Pages 928-931

  Trupke, T ^a   Bardos, R A ^a   Abbott, M D ^a   Chen, F W ^a   Cotter, J E ^a   Lorenz, A ^a,b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b Evergreen Solar ^*

Author keywords

[No Author keywords available]

Indexed keywords

BIAS CURRENTS; CHARACTERIZATION; CHARGE CARRIERS; IMAGE RESOLUTION; IMAGING SYSTEMS; PHOTOLUMINESCENCE;

HIGH SPATIAL RESOLUTION; MINORITY CARRIERS; PHOTOLUMINESCENCE (PL) IMAGING; PROCESSED CELLS;

SILICON WAFERS;

EID: 41749115158     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279608     Document Type: Conference Paper

References (11)

1. M. Bail et al., "Lifetime mapping of Si wafers by an infrared camera", 28th IEEE PVSC, Anchorage 2000.
2. S. Riepe et al., "Carrier density and lifetime imaging of silicon wafers by infrared lock-in thermography", 17th EPVSC, Munich 2001.
3. T. Fuyuki et al., Appl.Phys.Lett. 86, 2005, pp. 262108.
4. P. Pohl et al., "Temperature dependent infrared camera lifetime mapping (ILM)", 19th EPVSC, Paris, France 2004.
5. T. Trupke et al., "Photoluminescence: A surprisingly sensitive lifetime technique", 31st IEEE PVSC, Orlando, USA 2005.
6. R.A. Bardos et al., Appl.Phys.Lett. 88, 2006, pp. 053504.
7. T. Trupke et al., "Photoluminescence imaging of silicon wafers", Appl.Phys.Lett. accepted.
8. M.D. Abbott et al., "Application of Photoluminescence to High-efficiency Silicon Solar Cell Fabrication", this conference.
9. F.W. Chen et al., "Characterisation of PECVD silicon nitride passivation with photoluminescence imaging", this conference.
10. M.D. Abbott et al., "Application of Photoluminescence Characterisation to the Development and Manufacturing of High-Efficiency Silicon Solar Cells", Manuscript in preparation 2006.
11. R.A. Bardos et al., "Comparative analysis of n-type versus p-type string ribbon silicon wafers", this conference.