One shot mapping of minority carrier diffusion length in polycrystalline silicon solar cells using electroluminescence

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 1343-1345

  Fuyuki, Takashi ^a   Kondo, Hayato ^a   Kaji, Yasue ^a   Yamazaki, Tsutomu ^a   Takahashi, Yu ^a   Uraoka, Yukiharu ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTROLUMINESCENCE; POLYCRYSTALLINE MATERIALS; SOLAR CELLS;

MINORITY CARRIER DIFFUSION; RUNNING CURRENT DENSITY;

DIFFUSION;

EID: 27944449740     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. J.A.Eikelboom, C.Leguijt, C.F.A.Frumau and A.R.Burgers; Solar Energy Materials and Solar Cells, 36, 169 (1995).
2. O.Porre, M.Stemmer and M.Pasquinelli; Materials Science and Engineering B, 24, 188 (1994).
3. N.Sakitani, K.Nishioka, T.Yagi, Y.Yamamoto, Y.Ishikawa, Y.Uraoka and T.Fuyuki, Solid State Phenomena, 93, 351 (2003).
4. W. Seifert, M.Kittler and J.Vanhellemont; Materials Science and Engineering B, 42, 260 (1996).
5. T.Fuyuki, H.Kondo, T.Yamazaki, and Y.Takahashi; Applied Physics Letters (submitted).