Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach

Image and Vision Computing

Volumn 25, Issue 11, 2007, Pages 1785-1801

  Lin, Hong Dar ^a  

^a CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Detection of ripple defects; Hotelling T2 multivariate statistics; Machine vision; Wavelet characteristics

Indexed keywords

CAPACITORS; INSPECTION; MATHEMATICAL MODELS; STATISTICAL METHODS; WAVELET TRANSFORMS;

HOTELLING T2 MULTIVARIATE STATISTICS; RIPPLE DEFECTS; STATISTICAL MODELS; WAVELET CHARACTERISTICS;

COMPUTER VISION;

EID: 34547297326     PISSN: 02628856     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.imavis.2007.02.002     Document Type: Article

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