LED cosmetic flaw vision inspection system

Pattern Analysis and Applications

Volumn 1, Issue 1, 1998, Pages 62-70

  Fadzil, M H Ahmed ^a,c   Weng, C J ^b  

^a DEPARTMENT OF CHEMICAL ENGINEERING   (Malaysia)

^b Hewlett Packard Malaysia   (Malaysia)

^c SCHOOL OF PHYSICS   (Malaysia)

Author keywords

Feature extraction; Image processing; LED cosmetic flaw; Vision inspection

Indexed keywords

EID: 27544509239     PISSN: 14337541     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf01238027     Document Type: Article

References (7)

1. Ramesh J, Rangachar K, Brain OS. Machine Vision. McGraw-Hill, 1995
2. Otsu N. A threshold selection method from gray-level histograms. IEEE Transaction on System, Man and Cybernetics 1978; 9(8): 622-629
3. Lie WN. Automatic target segmentation by locally adaptive image thresholding. IEEE Transaction on Image Processing 1995; 4(7): 1036-1041
4. Gregory AB. Digital Image Processing, Principles and Applications. Wiley, 1995
5. Bassmann H. Ad Oculus Image Processing. DBS, 1991
6. Matrox Imaging Library Reference ver 3.1, Matrox, 1996
7. Matrox Imaging Library Command Reference ver3.1, Matrox, 1996