SCOPUS 정보 검색 플랫폼

Volumn 42, Issue 17, 2007, Pages 7607-7610

Low and increased solubility of silicon in metal nitrides: Evidence by X-ray absorption near edge structure

Author keywords

[No Author keywords available]

Indexed keywords

EVAPORATION; NITRIDES; PHOTONS; SINGLE CRYSTALS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION;

CATHODIC ARC EVAPORATION; CRYSTAL MONOCHROMATOR; SOLID-STATE FLUORESCENCE DETECTOR;

SILICON;

EID: 34547296515 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-007-1870-9 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.