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Volumn 76, Issue 1, 2007, Pages

Robust controlled-NOT gate in the presence of large fabrication-induced variations of the exchange interaction strength

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANT COMPUTER SYSTEMS; HAMILTONIANS; QUANTUM THEORY; ROTATION; SILICON COMPOUNDS;

EID: 34547272707     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.76.012302     Document Type: Article
Times cited : (31)

References (34)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.