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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 12, 2000, Pages 8223-8231

Residual strain in Ge pyramids on Si(111) investigated by x-ray crystal truncation rod scattering

(10) Kovats, Zoltan a Rauscher, Markus a Metzger, Hartmut a Peisl, Johann a Paniago, Rogério b Pfannes, Hans Dieter b Schulze, Jörg c Eisele, Ignaz c Boscherini, Federico d Ferrer, Salvador e

a UNIVERSITY OF MUNICH (Germany)

b FEDERAL UNIVERSITY OF MINAS GERAIS (Brazil)

c BUNDESWEHR UNIVERSITY MUNICH (Germany)

d UNIVERSITY OF BOLOGNA (Italy)

e EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; GERMANIUM; SILICON;

ARTICLE; CALCULATION; CRYSTAL STRUCTURE; LIGHT SCATTERING; MATHEMATICAL ANALYSIS; SYNTHESIS; X RAY CRYSTALLOGRAPHY;

EID: 0034664609 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.8223 Document Type: Article

Times cited : (20)

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