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Volumn 91, Issue 3, 2007, Pages
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Direct insertion of oxygen atoms into the backbonds of subsurface Si atoms using translational energies of oxygen atom beams
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Author keywords
[No Author keywords available]
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Indexed keywords
OXIDATION;
OXYGEN VACANCIES;
REACTION KINETICS;
SPECTROSCOPIC ELLIPSOMETRY;
SURFACE PROPERTIES;
SYNCHROTRON RADIATION;
OXYGEN ATOM BEAMS;
OXYGEN ATOMS;
TRANSLATIONAL ENERGIES;
CRYSTAL ATOMIC STRUCTURE;
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EID: 34547235015
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2759262 Document Type: Article |
Times cited : (5)
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References (15)
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