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Volumn 91, Issue 3, 2007, Pages

Direct insertion of oxygen atoms into the backbonds of subsurface Si atoms using translational energies of oxygen atom beams

Author keywords

[No Author keywords available]

Indexed keywords

OXIDATION; OXYGEN VACANCIES; REACTION KINETICS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PROPERTIES; SYNCHROTRON RADIATION;

EID: 34547235015     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2759262     Document Type: Article
Times cited : (5)

References (15)
  • 13
    • 0001166607 scopus 로고    scopus 로고
    • 0031-9007 10.1103/PhysRevLett.80.2000
    • K. Kato, T. Uda, and K. Terakura, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.80.2000 80, 2000 (1998); H. Watanabe, K. Kato, T. Uda, K. Fujita, M. Ichikawa, T. Kawamura, and K. Terakawa, Phys. Rev. Lett. 80, 345 (1998).
    • (1998) Phys. Rev. Lett. , vol.80 , pp. 2000
    • Kato, K.1    Uda, T.2    Terakura, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.