Effect of ion-irradiation induced defects on the nanocluster Si Er3+ coupling in Er-doped silicon-rich silicon oxide

Applied Physics Letters

Volumn 91, Issue 2, 2007, Pages

  Seo, Se Young ^a   Jeong, Hoon ^a   Shin, Jung H ^a   Choi, Han Woo ^b   Woo, Hyung Joo ^b   Kim, Joon Kon ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Institute of Geosceince and Mineral Resources   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON CYCLOTRON RESONANCE; ION BOMBARDMENT; NANOCLUSTERS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON COMPOUNDS; THIN FILMS;

EXCITATION CROSS SECTION; SILICON-RICH SILICON OXIDE (SRSO);

CRYSTAL DEFECTS;

EID: 34547172151     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2752538     Document Type: Article

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