Suppression of Auger deexcitation and temperature quenching of the Er-related 1.54 μm emission with an ultrathin oxide interlayer in an Er/SiO2/Si structure

Journal of Applied Physics

Volumn 93, Issue 5, 2003, Pages 2595-2601

  Kimura, Tadamasa ^a   Isshiki, Hideo ^a   Ide, Sawa ^a,b   Shimizu, Takanori ^a,c   Ishida, Takeshi ^a,b   Saito, Riichiro ^a  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^b HITACHI LTD   (Japan)

^c SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGERS; CRYSTALLINE MATERIALS; ENERGY TRANSFER; ERBIUM; IONS; PHONONS; QUENCHING;

AUGER DEEXCITATION;

SILICA;

EID: 0037352086     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1538320     Document Type: Article

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