New transport phenomena probed by dielectric spectroscopy of oxidized and non-oxidized porous silicon

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 5, 2007, Pages 1480-1485

  Urbach, B ^a   Axelrod, E ^a   Sa'ar, A ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DC-CONDUCTIVITY; OXIDIZED POROUS SILICON (PS); THERMAL ACTIVATION;

ACTIVATION ENERGY; ELECTRON TUNNELING; INFRARED SPECTROSCOPY; NANOCRYSTALS; OXIDATION; PHOTOLUMINESCENCE SPECTROSCOPY; POROUS SILICON; TRANSPORT PROPERTIES;

DIELECTRIC SPECTROSCOPY;

EID: 34547146527     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200674398     Document Type: Article

References (15)

1. M. Ben-Chorin, F. Moller, F. Koch, W. Schirmacher, and M. Eberhard, Phys. Rev. B 51, 2199 (1995).
2. Y. Lubianiker and I. Balberg, Phys. Rev. Lett. 78, 2433 (1997).
3. E. Axelrod, A. Givant, J. Shappir, Y. Feldman, and A. Sa'ar, Phys. Rev. B 65, 165429 (2002);
4. J. Non-Cryst. Solids 305, 235 (2002).
5. B. Urbach, E. Axelrod, and A. Sa'ar, submitted for publication.
6. E. Axelrod, B. Urbach, Y. Feldman, and A. Sa'ar, J. Phys. D 39, 1326 (2006).
7. P. Li, G. Z. Wang, and Y. R. Ma, Phys. Rev. B 58, 4057 (1998).
8. C. T. Kirk, Phys. Rev. B 38, 1255 (1988).
9. A. Borghesi, A. Sassella, B. Pivac, and L. Pavesi, Solid State Commun. 87, 1 (1993).
10. K. M. Davis and M. Tomozawa, J. Non-Cryst. Solids 201, 177 (1996).
11. C. J. F. Böttcher and P. Bordewijk, Theory of Electric Polarization (Elsevier, Amsterdam, 1992).
12. K. S. Cole and R. H. Cole, J. Chem. Phys. 9, 341 (1941).
13. I. Balberg, Phil. Mag. B 80, 691 (2000).
14. D. G. Yarkin, L. A. Balagurov, S. C. Bayliss, and I. P. Zvyagin, Semicond. Sci. Technol. 19, 100 (2004).
15. V. Lehmann, F. Hofmann, F. Moller, and U. Gruning, Thin Solid Films 255, 20 (1995).