Dielectric relaxation and transport in porous silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 16, 2002, Pages 1-7

  Axelrod, E ^a   Givant, A ^a   Shappir, J ^a   Feldman, Y ^a   Sa'ar A ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85038276977     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.65.165429     Document Type: Article

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