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Volumn 45, Issue 20-23, 2006, Pages

Limitations in through-focus depth sectioning in non-aberration corrected high-angle annular dark-field imaging

Author keywords

Electron tomography; High angle annular dark field imaging; InP; Scanning transmission electron microscopy; SrTiO3

Indexed keywords

ABERRATIONS; CRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; THICKNESS CONTROL; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33745316779     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.L602     Document Type: Article
Times cited : (7)

References (15)
  • 8
    • 33747105501 scopus 로고    scopus 로고
    • to be published
    • D. O. Klenov and S. Stemmer: to be published in Ultramicroscopy (2006); http://dx.doi.org/10.1016/j.ultramic.2006.03.007.
    • (2006) Ultramicroscopy
    • Klenov, D.O.1    Stemmer, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.