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Volumn 45, Issue 20-23, 2006, Pages
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Limitations in through-focus depth sectioning in non-aberration corrected high-angle annular dark-field imaging
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Author keywords
Electron tomography; High angle annular dark field imaging; InP; Scanning transmission electron microscopy; SrTiO3
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Indexed keywords
ABERRATIONS;
CRYSTALLINE MATERIALS;
SCANNING ELECTRON MICROSCOPY;
STRONTIUM COMPOUNDS;
THICKNESS CONTROL;
TOMOGRAPHY;
TRANSMISSION ELECTRON MICROSCOPY;
ATOM COLUMN INTENSITIES;
DARK-FIELD IMAGING;
ELECTRON TOMOGRAPHY;
HIGH-ANGLE ANNULAR DARK-FIELD (HAADF);
INP;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
SRTIO3;
IMAGE ANALYSIS;
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EID: 33745316779
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.45.L602 Document Type: Article |
Times cited : (7)
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References (15)
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