Effects of frequencies of AC modulation voltage on piezoelectric-induced images using atomic force microscopy

Materials Characterization

Volumn 52, Issue 4-5, 2004, Pages 319-322

  Xu, C H ^a   Woo, C H ^a   Shi, S Q ^a   Wang, Y ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Atomic force microscope; Modulation frequency; Piezoelectricity; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; FERROELECTRIC THIN FILMS; IMAGE ANALYSIS; MODULATION; PIEZOELECTRICITY; POLARIZATION; SPURIOUS SIGNAL NOISE; STRAIN;

LEAD ZIRCONATE TITANATE (PZT); MODULATION FREQUENCY; MODULATION VOLTAGE; PIEZOELECTRIC-INDUCED (PEI) IMAGES;

ELECTRIC POTENTIAL;

EID: 4544379391     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2004.06.006     Document Type: Article

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