Scanning probe microscopy of well-defined periodically poled ferroelectric domain structure

Applied Physics Letters

Volumn 80, Issue 10, 2002, Pages 1806-1808

  Shvebelman, M ^a   Urenski, P ^a   Shikler, R ^a   Rosenman, G ^a   Rosenwaks, Y ^a   Molotskii, M ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT MODE ATOMIC FORCE MICROSCOPY; DOMAIN STRUCTURE; FERROELECTRIC CRYSTAL; PERIODICALLY POLED;

ATOMIC FORCE MICROSCOPY; CRYSTALS; FERROELECTRIC MATERIALS; FERROELECTRICITY;

CRYSTAL ATOMIC STRUCTURE;

EID: 79956056870     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1456967     Document Type: Article

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