Characterization of nanometric quantum wells in semiconductor heterostructures by optical spectroscopy

International Journal of Modern Physics B

Volumn 18, Issue 12, 2004, Pages 1743-1758

  Laureto, E ^a   Vasconcellos, A R ^b   Meneses, E A ^b   Luzzi, R ^b  

^a STATE UNIVERSITY OF LONDRINA   (Brazil)

^b UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

Fractality in growth; Photoluminescence; Quality characterization; Quantum wells; Unconventional statistical approach

Indexed keywords

ANALYTIC METHOD; ARTICLE; QUANTUM MECHANICS; SEMICONDUCTOR; SPECTROSCOPY; STATISTICAL MODEL; SURFACE PROPERTY; THEORETICAL MODEL;

EID: 3442900245     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/S021797920402480X     Document Type: Article

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