Application of the `direct methods' difference sum function to the solution of reconstructed surfaces

Surface Science

Volumn 423, Issue 2, 1999, Pages 338-345

  Torrelles, X ^a   Rius, J ^a   Miravitlles, C ^a   Ferrer, S ^b  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE REFLECTION; RELAXATION PROCESSES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GERMANIUM; SURFACE PHENOMENA; SURFACE STRUCTURE; X RAY DIFFRACTION; X RAY SCATTERING;

DIFFERENCE SUM FUNCTION; SURFACE RECONSTRUCTION;

SINGLE CRYSTALS;

EID: 0344672398     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00928-5     Document Type: Article

References (9)

1. Torrelles X., Rius J., Boscherini F., Heun S., Mueller B.H., Ferrer S., Alvarez J., Miravitlles C. Phys. Rev. B. 57:1998;R4281.
2. Rius J., Miravitlles C., Allmann R. Acta Crystallogr. A. 52:1996;634.
3. International Tables for X-ray Crystallography, vol. II, Kynoch, Birmingham, 1959, pp. 355-357.
4. Buerger M.J. Vector Space. 1959;Wiley, New York.
5. Hermann C. Z. Crystallogr. 69:1929;533.
6. Takéuchi Y. Z. Kristallogr. 135:1972;120.
7. Rius J. Acta Crystallogr. A. 49:1993;406.
8. Ferrer S., Torrelles X., Etgens V.H., van der Vegt H.A., Fajardo P. Phys. Rev. Lett. 75:1995;1771.
9. Garreau Y., Sauvage-Simkin M., Jedrecy N., Pinchaux R., Veron M.B. Phys. Rev. B. 54:1996;17638.